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| TEK5020 |
| Abstract | This course provides the mechanisms for classification and pattern recognition. + |
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| Course Image | [[File:TEK5020.png|350px|right]] + |
| Keywords | Bayesian decision + , Supervised learning + , Cluster analysis + , Syntactic methods + |
| News | https://www.uio.no/studier/emner/matnat/its/TEK5020/index.html + |
| ResearchArea | Remote Sensing & Methods + |
| Title | Pattern Recognition + |
| Type of course | Master + |
| Has queryThis property is a special property in this wiki. | TEK5020 + |
| Creation dateThis property is a special property in this wiki. | 8 October 2013 09:15:41 + |
| Categories | Course + |
| Modification dateThis property is a special property in this wiki. | 13 February 2019 08:49:30 + |
| hide properties that link here |
| UNIK4590 | redirect page |
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